| An excellent method for measuring layer thickness is the use of white light interference. Principle: by illuminating samples with white light, interference spectrums are created as a function of the geometric layer thickness and refraction index due to the superposition of reflection spectrums caused by the upper and lower sides of the coating. Mathematical processes are used to evaluate this interference in the form of optical and geometrical layer thickness. Measurement is made contact-free and non-destructive. The results are highly accurate both regarding absolute accuracy and short- and long-term repeatability. |  Generation of interference
Calculation of layer thickness
Calculation of reflection
Brochure |