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 | | 2009-03-09:
Carl Zeiss ORION® Plus Helium-Ion-Microscope Now Offers Structural and Compositional Analysis in Addition to Sub-Nanometer Resolution Imaging
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 | |  21.11.2008
New Benchmark: Carl Zeiss Sets New World Record in Microscopy Resolution Using Scanning Helium Ions
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 | |  21.10.2008
R&D 100 Award: Carl Zeiss Receives Prestigious R&D 100 Award for Revolutionary Helium Ion Microscope |
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 | |  04.08.2008
ORION® PLUS: Improved Helium Ion Microscope Sets New Standards for Imaging Resolution and Brightness |
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 | |  17.07.2008
Prestigious Awards: ZEISS revolutionary Helium Ion Microscope Wins Two More Prestigious Awards |
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 | |  29.10.2007
Prestigious Award: Carl Zeiss Wins Wall Street Journal ‘Technology Innovations Award’
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 | |  01.10.2007
Harvard University: Harvard University’s Center for Nanoscale Systems Selects Imaging and Analysis Instruments from Carl Zeiss SMT |
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 | |  06.08.2007
New Microscopy Technology : Carl Zeiss SMT officially launches ORION™ Helium Ion Microscope at Microscopy & Microanalysis 2007 |
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 | |  17.07.2007
Successful: Carl Zeiss SMT Ships World’s First ORION™ Helium Ion Microscope to U.S. National Institute of Standards and Technology |
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