Hochwertige Daten intuitiv erfassen – mit nur einem REM für alles.
Die Systeme der ZEISS EVO Produktfamilie kombinieren leistungsstarke Rasterelektronenmikroskopie mit einem intuitiven Bedienkonzept, das für erfahrene Anwender und Neueinsteiger gleichermaßen gut geeignet ist. Mit den umfangreichen Optionen lässt sich ZEISS EVO präzise auf Ihre Anforderungen abstimmen – für die Materialwissenschaften ebenso wie für die routinemäßige industrielle Qualitätskontrolle und Schadensanalyse.
Erleben Sie eine neue Qualität bei der Prüfung Ihrer Proben.
ZEISS EVO ist das konventionelle Einstiegssystem mit einem Wolfram- oder LaB6-basierten Filament für täglich wiederholbare Bildgebungsaufgaben, z. B. hochauflösende Materialanalysen, mit weitgehend automatisierten und unterstützenden Arbeitsabläufen. Das System bietet Flexibilität für weniger anspruchsvolle Strukturgrößen.
Anwendungsgebiete
Qualitätsanalyse und Qualitätskontrolle
Fehleranalyse und Fraktographie
Materialographie
Sauberkeitskontrolle
Morphologische und chemische Analyse von Partikeln gemäß ISO 16232 und VDA 19 Teil 1 & 2
Analyse nicht-metallischer Einschlüsse
ZEISS EVO: Hochwertige Daten intuitiv erfassen – mit nur einem EM für alles
Erleben Sie eine neue Qualität bei der Prüfung Ihrer Proben. Bei ZEISS EVO stehen Ihnen eine Reihe an Konfigurationsoptionen zur Verfügung. So können Sie sich genau das System zusammenstellen, das Ihren Anforderungen entspricht – sowohl im Bezug auf die Leistung als auch auf Ihr Budget. Sie haben die Wahl zwischen drei Kammergrößen und können dazu die Auflösung konfigurieren, die zu Ihrer Anwendung passt.
Darüber hinaus können Sie auch Modi für Hochvakuum, variablen Druck oder Umgebungsdruck ausrüsten, je nach den von Ihnen untersuchten Proben. Um das System auf Ihre Anwendung zuzuschneiden, können Sie außerdem zwischen SE-, BSE-, EDX-, VP- und C2D-SE-Detektoren wählen. Mit ZEISS EVO kommen Sie zum erschwinglichen Preis in den vollen Genuss der Vorteile der Rasterelektronenmikroskopie.
Anwendungsbeispiele
Elektronik
Verunreinigung an Oberfläche: Zu sehen sind hier deutlich erkennbare Verschmutzungen und Fremdkörper auf der Oberfläche an einer integrierten Schaltung. Abgebildet mit dem SE-Detektor im Hochvakuum bei 10 kV.
Brennstoffzelle
Brennstoffzellen bestehen üblicherweise aus Platinelektroden, zwischen denen Polymerelektrolytmembranen liegen. Die kritischen Bauteile müssen bei niedrigen Spannungen abgebildet werden, um präzise Oberflächeninformationen in hoher Auflösung zu erhalten. Querschnitt mit LaB6-Quelle (links) und Wolfram-Quelle (rechts) bei 3 kV. Die LaB6-Quelle liefert mehr Oberflächeninformationen, bei niedriger Beschleunigungsspannung.
Verzinkter Weichstahl
Querschnitt von verzinktem Weichstahl, abgebildet mit dem SE-Detektor auf ZEISS EVO 15. Links: Gießharz; Mitte: Zinkschicht; rechts: Weichstahl.
BSE-Bilder von repräsentativen korrodierten Oberflächen mit EDX-Elementverteilung: Chrom, Blei, Kupfer, Nickel, Kohlenstoff und Sauerstoff.
Schadensanalyse an der Oberfläche eines Kugellagers
Die Oberfläche eines Kugellagers mit Rissen und Abplatzungen in der Struktur. Abgebildet mit dem BSE-Detektor.
Technische Sauberkeit
Partikel eines Partikelfilters: technische Sauberkeitsanalyse und Qualitätskontrolle.
ZEISS EVO Rasterelektronenmikroskop
10 Highlights in 90 Sekunden
Inhalt von Dritten geblockt
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Erfahren Sie, wie das Rasterelektronenmikroskop ZEISS EVO Ihre routinemäßigen Inspektions- und Schadensanalyseaufgaben in Qualitäts- und Materiallaboren unterstützt, indem es selbst für unerfahrene Anwender eine intuitive Bildgebung ermöglicht. EVO Highlights:- Hochauflösende Bildgebung - Effiziente Bedienung - Analyse der chemischen Zusammensetzung - Große Werkstücke - Großflächige Bilderfassung - Nicht-leitende Proben - EDX-Partikelanalyse - Automatisierte Messungen - Intelligente Bildsegmentierung - Bildkorrelation und gemeinsame Nutzung
Weitere Anwendungen in der Industrie:
Phasen-, Partikel- und Schweißnahtanalyse
Visuelle Inspektion von elektronischen Komponenten, integrierten Schaltkreisen, MEMS-Bauteilen und Solarzellen
Untersuchung der Oberfläche und Kristallstruktur von Kupferdraht
Untersuchung der Metallkorrosion
Analyse von intermetallischen Phasen und Phasenübergängen
Bildgebung und Analyse von Mikrorissen und Bruchfestigkeit
Prüfung von Beschichtungen und Verbundwerkstoffen
Prüfung von Schweißnähten und hitzebeeinflussten Zonen
„Mit dem ZEISS EVO finden wir die Nadel im Heuhaufen“,
19.09.2025
Starke Drähte. Smarte Stents.
ZEISS EVO optimiert Qualität bei Ingpuls: Zuverlässige REM-Analyse für ultra-dünne Nitinol-Stentdrähte.
Möchten Sie unsere Produkte oder Dienstleistungen näher kennenlernen? Gerne geben wir Ihnen weitere Informationen oder bieten Ihnen eine Live-Demo an, entweder online oder persönlich.
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